• Responsible for supporting a variety of semiconductor applications using Scanning Electron Microscope (SEM) to image challenging structures.
• Experience in imaging samples on a wafer level taking profile, sidewalls, and top down images on the SEM
• Some experience with EDS analysis
• Have knowledge on image optimization on the SEM for various materials
• Have the ability to contribute to development of best known methods (BKM) for SEM imaging of new applications
• Be able to perform SEM alignments and correct basic fault conditions on metrology equipment
• Must possess good written and verbal communication skills to work with large internal customer base.

Minimum Qualifications

• AS/BS in related field of discipline or equivalent
• Minimum of 2 years SEM experience
• This is a graduate eligible role.

• Associates degree in technical field

We believe it is important for every person to feel valued, included, and empowered to achieve their full potential. By bringing unique individuals and viewpoints together, we achieve extraordinary results.

Lam Research ("Lam" or the "Company") is an equal opportunity employer. Lam is committed to and reaffirms support of equal opportunity in employment and non-discrimination in employment policies, practices and procedures on the basis of race, religious creed, color, national origin, ancestry, physical disability, mental disability, medical condition, genetic information, marital status, sex (including pregnancy, childbirth and related medical conditions), gender, gender identity, gender expression, age, sexual orientation, or military and veteran status or any other category protected by applicable federal, state, or local laws. It is the Company's intention to comply with all applicable laws and regulations. Company policy prohibits unlawful discrimination against applicants or employees.